Services and areas of expertise

SINGLE CRYSTALS

Measurement of diffracted intensities, determination of crystal lattice and space group, crystal orientation, resolution and refinement of the 3D structure of the crystallized object. Measurements under standard conditions at ambient temperature and pressure. Measurements under high pressure in anvil diamond cell (CED).

POLYCRYSTALLINE MATERIALS

Qualitative analyzes of samples under standard conditions (15-positions automatic sample changer). Phase identification. Quantitative analysis by Rietveld refinement. Measurements at low (-193 ° C minimum) or high temperature (up to 1200 ° C). Measurements under controlled atmosphere (anoxic cell developed at IMPMC) or under high pressure measurements in Diamond Anvil Cell.

AMORPHOUS AND NANOMATERIAL MATERIALS

Wide angle X-ray scattering (WAXS) in a wide range of scattering factors (up to Q = 22 Å-1), allowing studies by pair distribution function analysis (PDF).