The SEM-FIB microscopy facility at IMPMC

© IMPMC - Cécile Duflot

The SEM-FIB microscopy facility at IMPMC provides Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) expertise for all researchers (from academy and industry)needing versatile, high resolution, state-of-the art electron and ion microscopies to characterize their materials at the nanoscale. The SEM-FIB microscopy facility contains a suite of SEM and FIB microscopes well suited for characterizing nanoscale structures and chemical compositions via a range of imaging and analytical methods. There is also a set of specimen preparation facilities including a coating unit and a critical point drier.

Microscopes

• SEM-FEG Zeiss Ultra55 (Scanning Electron Microscope): for more detailed information
• FIB Zeiss Neon40EsB (Focused Ion Beam): for more detailed information

Specimen preparation tools

• Leica EM CPD300 (Critical Point Drier) 
• Leica EM SCD500 (UHR Carbon evaporating and metal sputtering coater)

Contact

Imène Esteve (Imene.Esteve @ impmc.upmc.fr)
Tel : +33 1 44 27 48 07 ou +33 1 44 27 98 12

IMPMC- Institut de Minéralogie et de Physique des Matériaux et de Cosmochimie

Université Pierre et Marie Curie- UPMC-Campus Jussieu

4, place de Jussieu, 75005 Paris, France

Tower 23, corridor 13-23, RDC (Niveau Saint-Bernard)